首頁 > 網路資源 > 大同大學數位論文系統

Title page for etd-0807106-170334


URN etd-0807106-170334 Statistics This thesis had been viewed 1968 times. Download 15 times.
Author Jing-Tau Chen
Author's Email Address No Public.
Department Communication Engineering
Year 2005 Semester 2
Degree Master Type of Document Master's Thesis
Language English Page Count 62
Title THE AUTOMATIC SYSTEM OF DEFECT DETECYION FOR FPCB AND PCB
Keyword
  • Haar Transform
  • Diagonalwise Wavelet Transform
  • Wavelet Transform
  • Wavelet Transform
  • Diagonalwise Wavelet Transform
  • Haar Transform
  • Abstract Wavelet transform is the new theory that has been developed in these years, and wavelet transform applied to frequency and time domain characteristics. Due to wavelet transformation has multi-resolution analytical characteristic, which can use wavelet transform to analyze defects of structural texture possible.
    The FPCB board is constructed from three structural textures: vertical, horizontal or oblique in degrees of 45 or 135 diagonal. In the method, the inspection is mainly divided into two parts. First part mainly aims at defects inspection of the horizontal and vertical circuit lines. The part makes wavelet transform in accordance with the original image, and reconstructions of the defect parts existing. The other part will spread the original image to become the new rhombus, and use the DWT transform to detect the defects. So to detect the original images, that can’t turn the images.
       In the images input scheme, we integrate CCD camera, robot arm and related hardware to catch the images of FPCB. There are two parts of image reprocessing, one to solve the ripper effect by slow down the CCD camera scanning speed; the other is to solve the scanning table with the impurity by smoothing the image.
       This thesis aims mainly at the defects inspection of the oblique circuit lines on FPCB to lower the operation cost and procession time, and improve the efficiency accuracy and realization possibility of the hardware to reach the goal of automatic defects inspection.
    Advisor Committee
  • Chau-Yun Hsu - advisor
  • none - co-chair
  • none - co-chair
  • Files indicate in-campus access only
    Date of Defense 2006-07-10 Date of Submission 2006-08-07


    Browse | Search All Available ETDs